Advanced Transmission Electron Microscopy

The primary goal of my research is to enable an atomic-scale understanding of energy-relevant materials by advanced transmission electron microscopy. We combine quantitative atomic resolution imaging, spectroscopy and in situ microscopy techniques to probe and observe materials under realistic conditions. Ultimately, we want to establish new microscopy methods to image the dynamic evolution of materials at three-dimensional atomic resolution. The four main pillars of our research are:

  1. Quantitative atomic resolution imaging: We develop methods in the scanning transmission electron microscope to obtain quantitative information of complex materials and interfaces at atomic resolution. We apply the techniques to image novel interfacial structures, ferroic oxides and complex quantum materials.

  2. Multimodal electron microscopy: Four-dimensional scanning electron microscopy is used to determine local magnetic and electric fields, and to resolve light elements at atomic resolution. We develop electron ptychography techniques to image complex materials and interfaces towards obtaining three-dimensional atomic resolution. Spectroscopic techniques are used to determine the local composition, electronic structure and bonding down to the atomic level.

  3. In situ electron microscopy: We design new experimental setups to observe dynamic material evolution under external stimuli. The in situ microscopy techniques range from high temperature to cryogenic conditions while applying electrical bias, magnetic fields or strain to the samples. These methodologies are combined with novel imaging modalities to probe the evolution of atomic structure, composition and magnetic texture.

  4. Computational microscopy: We use computational tools to analyze and simulate the multidimensional datasets to turn the data into physics-based quantities. Image simulations provide a direct link to atomic structures obtained from first-principles and atomistic simulations. Machine learning models are developed to automatically quantify the microscopy data and to pave the way for autonomous microscopy operation.

We combine atomic imaging, dynamic probing of materials under external stimuli and novel computational methods to establish a holistic understanding of material functionality down to the atomic-scale.

Prof. Dr. Christian Liebscher

Advanced Transmission Electron Microscopy

Phone: +49 234 32 15665

E-Mail:

Christian Liebscher has held the professorship for Advanced Transmission Electron Microscopy at Ruhr University Bochum since April 2024. The newly established professorship is not only part of the Research Centre Future Energy Materials and Systems, but is based at the Faculty of Physics and Astronomy. Liebscher previously conducted research at the University of California, Berkeley, and has been a research group leader at the Max Planck Institute for Iron Research (MPIE) in Düsseldorf since 2015. Liebscher's professorship will play a central role within the RC FEMS in linking the functional properties of energy materials with their structural and atomic composition. This fundamental understanding is seen as a prerequisite for developing and customising new types of materials.

Website

https://www.physik.ruhr-uni-bochum.de/en/Professuren/prof-dr-liebscher-christian/ _blank

Dr. Christoph Flathmann

Advanced Transmission Electron Microscopy

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Dr. Dylan Jennings

Advanced Transmission Elelctron Microscopy

Dr. Ruben Bueno Villoro

Advanced Transmission Electron Microscopy

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Hui Ding

Advanced Transmission Electron Microscopy

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My research focuses on the structural characterization of materials across multiple length scales using aberration-corrected (scanning) transmission electron microscopy. I am also particularly interested in understanding the dynamic behavior of these materials under external stimuli—such as temperature, electric fields, and mechanical strain—using in situ TEM techniques. Additionally, advanced methods like 4D-STEM and ptychography play a significant role in my work, enabling high-resolution imaging and quantitative analysis of complex material structures.

Natalja Ivanova

Advanced Transmission Electron Microscopy

Phone: +49 0 234 -32 15591

E-Mail:

I am the team assistant at the Chair of Advanced Transmission Electron Microscopy and have been dedicated to integrating and establishing all administrative matters since the inception of the chair. I am excited to grow together with the team and grateful for the opportunity to gain insight into the scientific work.

Vahid Tavakkoli

Advanced Trasmission Elctron Microscopy

Zafran Shah